3d optical surface profiler

NV-1800 is a manual type of non-contact 3D profiler for any surface. Own patented algorithms and White Light Interferometry. The patented WSI/PSI technology measures a wide variety of surface materials and parameters, including 2D and 3D profiling of surface texture, form, step-height and more (0.1 nm – vertical and 0.2 um–lateral resolution).

NVM series are the full automated inspection tool of IC substrate and specifically designed to measure each layer of the PCB panels during manufacturing, It can measure large field of view (500㎟) by stitching.